APPENDIX: Contributors and Participants
WRITING CONTRIBUTORS
Gibson L. Batch, 3M
Lee Landis Blyler, Jr., AT&T Bell Laboratories
Martin C. Cornell, The Dow Chemical Company
David F. Eaton, E.I. du Pont de Nemours & Co.
Bruce E. Eichinger, BioSym Technologies
Karl F. Freed, University of Chicago
John L. Gardon, AKZO Coatings Am-ICA
Russell Gaudiana, Polaroid
Steve Goldman, Proctor and Gamble Company
William W. Graessley, Princeton University
Werner Grootaert, 3M
James E. Guillet, University of Toronto
Edward G. Howard, E.I. du Pont de Nemours & Co.
Richard Ingwall, Polaroid
Michael Jaffe, Hoechst Celanese Corporation
Peter C. Juliano, General Electric Company
Robert S. Langer, Massachusetts Institute of Technology
Mel A. Leitheiser, 3M
Andrew Lovinger, AT&T Bell Laboratories
Alan G. MacDiarmid, University of Pennsylvania
L.T. Manzione, AT&T Bell Laboratories
P.A. Mirau, AT&T Bell Laboratories
James Moore, Rensselaer Polytechnic Institute
Murugappan Muthukumar, University of Massachusetts
Allen Noshay, Union Carbide Corporation
Alphonsus V. Pocius, 3M
John F. Rabolt, IBM Almaden Research Center
Kenneth L. Reifsnider, Virginia Polytechnic Institute and State University
Thomas P. Russell, IBM Almaden Research Center
Felix Theeuwes, ALZA Corporation
Garth L. Wilkes, Virginia Polytechnic Institute and State University
David J. Williams, Eastman Kodak Company
Gary E. Wnek, Rensselaer Polytechnic Institute
Fred Wudl, University of California at Santa Barbara
Do Y. Yoon, IBM Almaden Research Center
Bruno H. Zimm, University of California at San Diego
QUESTIONNAIRE PARTICIPANTS
R. Stephen Berry, University of Chicago
Paul Calvert, University of Arizona
John G. Curro, Sandia National Laboratory
Alan D. English, E.I. du Pont de Nemours & Co.
Glenn H. Fredrickson, University of California at Santa Barbara
Peter C. Juliano, General Electric Company
Wayne L. Mattice, University of Akron
Robert M. Nowak, Dow Chemical Company
Eli M. Pearce, Polymer Research Institute, Polytechnic University, Brooklyn
Philip Pincus, University of California at Santa Barbara
Hans Pohlmann, Amoco Chemical Corporation
Durward T. Roberts, Bridgestone/Firestone
Ann Salamone, Rochal Industries
Edward T. Samulski, University of North Carolina at Chapel Hill
George Schmeltzer, Miles
Matthew V. Tirrell, University of Minnesota
S. Richard Turner, Eastman Kodak Company
Garth L. Wilkes, Virginia Polytechnic Institute and State University
Tom Wollner, 3M
Hyuk Yu, University of Wisconsin at Madison
WORKSHOP PARTICIPANTS
Charles E. Browning, Wright Laboratory, Wright-Patterson Air Force Base
Stuart L. Cooper, University of Wisconsin at Madison
Kenneth A. Dill, University of California at San Francisco
Andrew E. Feiring, E.I. du Pont de Nemours & Co.
William W. Graessley, Princeton University
James E. Guillet, University of Toronto
Melvin A. Leitheiser, 3M
Bruce M. Novak, University of California at Berkeley
Virgil Percec, Case Western Reserve University
John F. Rabolt, IBM Almaden Research Center
Steven D. Smith, Proctor and Gamble Company
Edwin L. Thomas, Massachusetts Institute of Technology
George M. Whitesides, Harvard University
Joseph G. Wirth, Raychem Corporation
Martel Zeldin, Indiana University and Purdue University at Indianapolis