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OCR for page 217
An Assessment of the NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY MEASUREMENT AND STANDARDS LABORATORIES Fiscal Year 1998 Appendix D Acronyms and Abbreviations AC— alternating current ACSL— Advanced Chemical Sciences Laboratory ADAHF— American Dental Association Health Foundation AEC— architecture-engineering-construction AES— Advanced Encryption Standard AES— Auger electron spectroscopy (spectrometer) AHP— analytical hierarchy process AIS— advanced insulation system ALOFT— A Large Outdoor Fire Plume Trajectory (model) AMCIT— Advanced Measurement Center for Information Technology AML— Advanced Measurement Laboratory AMSANT— Advanced Manufacturing Systems and Networking Testbed APTD— Automated Production Technology Division ASHRAE— American Society of Heating, Refrigerating, and Air-conditioning Engineers ASTM— American Society for Testing and Materials ATM— asynchronous transfer mode ATP— Advanced Technology Program BACnet— Building Automation and Controls Network BEC— Bose-Einstein condensation BEES— Building for Environmental and Economic Sustainability BFRL— Building and Fire Research Laboratory BLAS— Basic Linear Algebra Subprograms BMCD— Biological Macromolecule Crystallization Database BT— beam tube CAD— computer-aided design CALS— Continuous Acquisition and Life-cycle Support CAM— computer-aided manufacturing CARB— Center for Advanced Research in Biotechnology CBS— Cybernetic Building Systems CC— common criteria CFC— chlorofluorocarbon CFD— computational fluid dynamics CHRNS— Center for High-Resolution Neutron Scattering CICE— computer-integrated construction environment(s)
OCR for page 218
An Assessment of the NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY MEASUREMENT AND STANDARDS LABORATORIES Fiscal Year 1998 CIKS— Computer-Integrated Knowledge System(s) CIRMS— Council on Ionizing Radiation Measurements and Standards CKMech— chemical kinetic mechanisms database CMM— coordinate measuring machine CMOS— complementary metal oxide semiconductor CNRF— Cold Neutron Research Facility CODATA— Committee on Data for Science and Technology CONTAM— a multizone indoor air-quality model designed to track airflow and contaminant dispersal CRADA— Cooperative Research and Development Agreement CRDS— cavity ring-down spectroscopy CSTL— Chemical Science and Technology Laboratory CTCMS— Center for Theoretical and Computational Materials Science CVD— chemical vapor deposition CW— continuous wave CWC— Chemical Weapons Convention D/H— deuterium to hydrogen ratio DARPA— Defense Advanced Research Projects Agency DARTS— double-axis residual stress/single-crystal diffractometer DCISD— Distributed Computing and Information Services Division DMD— differential mode delay DVD— digital video disk EC— electronic commerce EDFA— erbium-doped fiber amplifier EDS— energy dispersive spectrometer EEEL— Electronics and Electrical Engineering Laboratory EFT— electronic funds transfer EMF— electromagnetic field EPA— Environmental Protection Agency ESD— electrostatic discharge EUV— extreme ultraviolet FDA— Food and Drug Administration FDD— fault detection and diagnosis FedCIRC— Federal Computer Incident Response Capability FM— frequency modulation FT— Fourier transform FTIR— Fourier transform infrared FTP— full-time permanent GAMS— Guide to Available Mathematical Software GC/MS— gas chromatography/mass spectrometry GHRS— Goddard high-resolution spectrometer GMR— giant magnetoresistance GPS— Global Positioning System
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An Assessment of the NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY MEASUREMENT AND STANDARDS LABORATORIES Fiscal Year 1998 HCFC— hydrochlorofluorocarbon HFC— hydrofluorocarbon HPC— high-performance computing HPCC— high-performance computing and communications HPSSD— High Performance Systems and Services Division HTS— high-temperature superconductive HST— Hubble Space Telescope HVAC— heating, ventilation, and air conditioning IAQ— indoor air quality ICP-MS— inductively coupled plasma mass spectroscopy ICP-OES— inductively coupled plasma-optical emission spectrometry ICSSC— Interagency Committee on Seismic Safety in Construction IEC— International Electrotechnical Commission IEEE— Institute of Electrical and Electronics Engineers IETF— Internet Engineering Task Force IMPI— interoperable message passing interface IP— Internet Protocol IPsec— Internet Security Protocol IR— infrared ISD— Intelligent Systems Division ISO— International Organization for Standardization IT— information technology ITL— Information Technology Laboratory ITS-90— International Temperature Scale of 1990 LC— liquid chromatography LCC— life-cycle cost LFPG— low-frost-point generator MALDI— matrix-assisted laser desorption ionization MCSD— Mathematical and Computational Sciences Division MEL— Manufacturing Engineering Laboratory MEMS— microelectromechanical systems MEP— Manufacturing Extension Partnership MIRF— Medical-Industrial Radiation Facility MMIC— microwave monolithic integrated circuit MOIST— moisture flow analysis software MR— magnetic resonance MS— mass spectrometry MSEL— Materials Science and Engineering Laboratory MSID— Manufacturing Systems Integration Division NAAQS— National Ambient Air Quality Standards NAMT— National Advanced Manufacturing Testbed NASA— National Aeronautics and Space Administration NCNR— NIST Center for Neutron Research
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An Assessment of the NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY MEASUREMENT AND STANDARDS LABORATORIES Fiscal Year 1998 NFG— nonfederal government NHPS— National Network for High Performance Seismic Simulation NIAP— National Information Assurance Partnership NICE-OHMS— Noise-Immune Cavity-Enhanced Optical Heterodyne Molecular Spectroscopy NIDR— National Institute of Dental Research NIH— National Institutes of Health NMR— nuclear magnetic resonance NOAA— National Oceanic and Atmospheric Administration NSF— National Science Foundation NSMP— National Semiconductor Metrology Program NSOM— near-field scanning optical microscopy NSTC— National Science and Technology Council NTRM— NIST Traceable Reference Materials NTRS— National Technology Roadmap for Semiconductors OA— other agency OAE— Office of Applied Economics OIDA— Optoelectronics Industry Development Association OLES— Office of Law Enforcement Standards OMP— Office of Microelectronics Programs Open/GL— open/graphics language PAC— Program Advisory Committee PED— Precision Engineering Division PET— positron emission tomography PHPCT— Partnership for High-Performance Concrete Technology PKI— public-key infrastructure PlantSTEP— the use of STEP for exchange of plant engineering information RCS— radar cross section REFPROP— refrigerant properties RF— radio frequency Rs— surface resistance RTM— resin transfer molding SANS— small-angle neutron scattering SCALPEL— scattering with angular limitation projection electron-beam lithography SED— Statistical Engineering Division SEM— scanning electron microscopy SEMATECH— Semiconductor Manufacturing Technology (consortium) SEMPA— scanning electron microscopy with polarization analysis SET— single-electron tunneling SFG— sum frequency generation SI— International System of Units SIA— Semiconductor Industry Association SIM— Inter-American System for Metrology SIMS— secondary ion-mass spectrometry
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An Assessment of the NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY MEASUREMENT AND STANDARDS LABORATORIES Fiscal Year 1998 SNS— spallation neutron source SPINS— spin polarized inelastic neutron scattering SRD— Standard Reference Data SRIM— structural reaction injection molding SRMs— Standard Reference Materials SRR— social rate of return STEP— standard for the exchange of product model data STM— scanning tunneling microscopy StRD— statistical reference dataset STRs— short tandem repeats STRS— Scientific and Technical Research and Services SURF— Synchrotron Ultraviolet Radiation Facility TBC— thermal barrier coating Tc— critical temperature U.S. NRC— U.S. Nuclear Regulatory Commission UV— ultraviolet VAMAS— Versailles Project on Advanced Materials and Standards VM— virtual machine VRML— Virtual reality modeling language V-t— voltage time WD-XRF— wavelength dispersive x-ray fluorescence XPS— x-ray photoelectron spectroscopy (spectrometer)
Representative terms from entire chapter: