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Suggested Citation:"D Acronyms and Abbreviations." National Research Council. 1999. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 1999. Washington, DC: The National Academies Press. doi: 10.17226/9685.
×

Appendix D

Acronyms and Abbreviations

ACerS—

American Ceramic Society

ACSL—

Advanced Chemical Sciences Laboratory

ADL—

architecture description language

AEC—

architecture-engineering-construction

AES—

Auger electron spectroscopy; advanced encryption standard

AFIS—

Automated Fingerprint Identification System

AFM—

atomic force microscopy

AHP—

analytical hierarchy process

AML—

Advanced Measurement Laboratory

ANSI—

American National Standards Institute

AP—

application protocol

API—

application programming interfaces

APS—

American Physical Society

ASCE—

American Society of Civil Engineers

ASHRAE—

American Society of Heating, Refrigerating, and Air-conditioning Engineers

ASTM—

American Society for Testing and Materials

ATM—

asynchronous transfer mode

ATP—

Advanced Technology Program

BACnet—

Building Automation and Controls Network

BEC—

Bose-Einstein Condensation

BEES—

Building for Environmental and Economic Sustainability

BFRL—

Building and Fire Research Laboratory

BIPM—

Bureau International des Poids et Mésures

BMCD—

Biological Macromolecule Crystallization Database

BRDF—

bidirectional reflectance distribution function

BSED—

backscatter electron diffraction

CAD—

computer-aided design

CAM—

computer-aided manufacturing

CARB—

Center for Advanced Research in Biotechnology

CBS—

Cybernetic Building Systems

CD—

critical dimension

CFD—

computational fluid dynamics

CHRNS—

Center for High Resolution Neutron Scattering

CICE—

Computer-Integrated Construction Environment

CIKS—

computer-integrated knowledge systems

CIRMS—

Council on Ionizing Radiation Measurements and Standards

Suggested Citation:"D Acronyms and Abbreviations." National Research Council. 1999. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 1999. Washington, DC: The National Academies Press. doi: 10.17226/9685.
×

CIS—

closed ion source

CMM—

coordinated measuring machine

CMOS—

complementary metal oxide semiconductor

CRADA—

Cooperative Research and Development Agreement

CRDS—

cavity ring-down spectrometry

CSIRO—

Commonwealth Scientific and Industrial Research Organisations

CSTL—

Chemical Science and Technology Laboratory

CTCMS—

Center for Theoretical Computational Materials Science

DARPA—

Defense Advanced Research Projects Agency

DASE—

Digital TV Application Software Environment

EBIT—

electron beam ion trap

EDFA—

erbium-doped fiber amplifier

EDS—

energy-dispersive spectrometer

EEEL—

Electronics and Electrical Engineering Laboratory

EMC—

electromagnetic compatibility

ENDF—

Evaluated Nuclear Data File

EOS—

Earth Observing System

EPA—

Environmental Protection Agency

EPR—

electron paramagnetic resonance

EUV—

extreme ultraviolet

EUVL-LLC—

EUV Lithography-Limited Liability Corporation

FARCAL—

Facility for Advanced Radiometric Calibrations

FASCAL—

Facility for Automatic Spectroradiometric Calibrations

FBI—

Federal Bureau of Investigation

FDD—

fault detection and diagnostics

FDIS—

Final Draft International Standard

FIZ—

Fachinformationszentrum Karlsruhe

FSM—

Fire-Safe Materials

FTIR—

Fourier transform infrared

FTMW—

Fourier transform microwave

FTS—

Fourier transform spectrometer

GAMS—

Guide to Available Mathematical Software

GaN—

gallium nitride

GD-OES—

glow discharge optical emission spectrometer

GHRS—

Goddard High Resolution Spectrograph

GMR—

Giant Magnetoresistance

GPS—

Global Positioning System

HACR—

high-accuracy cryogenic radiometer

HDTV—

high-definition television

HPC—

high-performance concrete

HST—

Hubble Space Telescope

HTBB—

high-temperature black body

HVAC—

heating, ventilation, and air-conditioning

HYPERCON—

computer-integrated knowledge system

Suggested Citation:"D Acronyms and Abbreviations." National Research Council. 1999. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 1999. Washington, DC: The National Academies Press. doi: 10.17226/9685.
×

IC—

integrated circuit

ICP-OES—

inductively coupled plasma-optical spectrometry

IEC—

International Electrotechnical Commission

IEEE—

Institute of Electrical and Electronics Engineers

IETF—

Internet Engineering Task Force

IFSS—

Industrial Fire Simulation System

IP—

Internetwork Protocol

IP QoS—

IP Quality of Service

IPsec—

Internetwork Protocol Security

IR—

infrared; information retrieval

ISAM—

Intelligent Systems Architecture for Manufacturing

ISIS—

Information Storage and Interconnect Systems

ISO—

International Organization for Standardization

ISPI—

Integrated Services Protocol Instrument

ISSC—

Information System to Support Calibrations

IT—

information technology

ITL—

Information Technology Laboratory

ITS—

International Temperature Scale

LCC—

life-cycle cost

LCM—

liquid composites molding

LMDS—

Local Multipoint Distribution Service

M³—

molecular measuring machine

MALDI—

matrix-assisted laser desorption ionization

MBE—

molecular beam epitaxy

MEL—

Manufacturing Engineering Laboratory

MEMS—

microelectromechanical systems

MEP—

Manufacturing Extension Partnership

MFC—

mass flow controller

MIRF—

Medical and Industrial Radiation Facility

MMDS—

Multichannel Multipoint Distribution Service

MMIC—

monolithic microwave integrated circuit

MOCVD—

metallo-organic chemical vapor deposition

MPI—

Message Passing Interface

MR—

magnetic resonance

MS—

mass spectral

MSD—

Metrology for Sustainable Development

MSEL—

Materials Science and Engineering Laboratory

NAMT—

National Advanced Manufacturing Testbed

NASA—

National Aeronautics and Space Administration

NCNR—

NIST Center for Neutron Research

NFG—

nonfederal governmental

NIAP—

National Information Assurance Partnership

NIH—

National Institutes of Health

NIOF—

Neutron Interferometry and Optics Facility

Suggested Citation:"D Acronyms and Abbreviations." National Research Council. 1999. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 1999. Washington, DC: The National Academies Press. doi: 10.17226/9685.
×

NIST—

National Institute of Standards and Technology

NMR—

nuclear magnetic resonance

NOAA—

National Oceanic and Atmospheric Administration

NRC—

National Research Council

NRL—

Naval Research Laboratory

NSA—

National Security Agency

NSF—

National Science Foundation

NSMP—

National Semiconductor Metrology Program

NSOM—

near-field scanning optical microscopy

NTRM—

NIST Traceable Reference Materials

NTRS—

National Technology Roadmap for Semiconductors

N-WEST—

National Wireless Electronic Systems Testbed

OA—

other government agencies

OAE—

Office of Applied Economics

OAS—

Organization of American States

OES—

optical emission spectroscopy

OIDA—

Optoelectronics Industry Development Association

OLCI—

optical low-coherence interferometry

OLES—

Office of Law Enforcement Standards

OMP—

Office of Microelectronics Programs

PCR—

polymerase chain reaction

Pd—

palladium

PDF—

portable document format

PHPCT—

Partnership for High-Performance Concrete Technology

PKI—

Public Key Infrastructure

PMD—

polarization mode dispersion

PMMA—

polymethylmethacrylate

PSSH—

Performance Standards Systems for Housing

Pt—

platinum

RBAC—

role-based access control

RCS—

radar cross section

RCSB—

Research Collaboratory for Structural Bioinformatics

REFPROP—

refrigerant properties database

RF—

radio frequency

RIMS—

resonance ionization mass spectrometry

RMA—

Reference Model Architecture

RTP—

rapid thermal processing

SAC—

Safety Audit Committee

SAM—

self-assembling monolayer

SCM—

scanning capacitance microscopy

SEMATECH—

semiconductor manufacturing technology (consortium)

SEMPA—

scanning electron microscopy for polarization analysis

SI—

International System of Units

SIA—

Semiconductor Industry Association

Suggested Citation:"D Acronyms and Abbreviations." National Research Council. 1999. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 1999. Washington, DC: The National Academies Press. doi: 10.17226/9685.
×

SIMnet—

Inter-American System of Metrology

SIMS—

secondary ion mass spectrometry

SIRCUS—

spectral irradiance and radiance calibration with uniform sources

SLP—

Service Life Prediction

SPIE—

Society of Photo-optical Instrumentation Engineers

SRD—

Standard Reference Database

SRM—

Standard Reference Material

SRO—

senior reactor operator

STARR—

spectral trifunction automated reference reflectometer

STEP—

standard(s) for the exchange of product model data

STM—

scanning tunneling microscopy

STR—

short tandem repeat

STRS—

Scientific and Technical Research and Services

SURF—

Synchrotron Ultraviolet Radiation Facility

Tc

critical temperature

THz—

terahertz

TOF—

time of flight

TREC—

Text Retrieval Conference

TWG—

technical working group

UL—

Underwriters Laboratories

ULSI—

ultralarge-scale integration

USNO—

United States Naval Observatory

UTC—

coordinated universal time

UV—

ultraviolet

VCBT—

Virtual Cybernetic Building Testbed

VL-BKZ—

Valanis-Landel-Bernstein, Kersley, and Zapas

VRML—

virtual reality modeling language

VTT—

Technical Research Centre of Finland

VUV—

vacuum ultraviolet

WD XRF—

wavelength dispersive x-ray fluorescence

WIT—

Web-based Interoperability Test

XIWT—

Cross-Industry Working Team

XML—

extensible markup language

XPS—

x-ray photoelectron spectroscopy

Suggested Citation:"D Acronyms and Abbreviations." National Research Council. 1999. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 1999. Washington, DC: The National Academies Press. doi: 10.17226/9685.
×
Page 231
Suggested Citation:"D Acronyms and Abbreviations." National Research Council. 1999. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 1999. Washington, DC: The National Academies Press. doi: 10.17226/9685.
×
Page 232
Suggested Citation:"D Acronyms and Abbreviations." National Research Council. 1999. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 1999. Washington, DC: The National Academies Press. doi: 10.17226/9685.
×
Page 233
Suggested Citation:"D Acronyms and Abbreviations." National Research Council. 1999. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 1999. Washington, DC: The National Academies Press. doi: 10.17226/9685.
×
Page 234
Suggested Citation:"D Acronyms and Abbreviations." National Research Council. 1999. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 1999. Washington, DC: The National Academies Press. doi: 10.17226/9685.
×
Page 235
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