Appendix D

Acronyms and Abbreviations

ACerS—

American Ceramic Society

ACSL—

Advanced Chemical Sciences Laboratory

ADL—

architecture description language

AEC—

architecture-engineering-construction

AES—

Auger electron spectroscopy; advanced encryption standard

AFIS—

Automated Fingerprint Identification System

AFM—

atomic force microscopy

AHP—

analytical hierarchy process

AML—

Advanced Measurement Laboratory

ANSI—

American National Standards Institute

AP—

application protocol

API—

application programming interfaces

APS—

American Physical Society

ASCE—

American Society of Civil Engineers

ASHRAE—

American Society of Heating, Refrigerating, and Air-conditioning Engineers

ASTM—

American Society for Testing and Materials

ATM—

asynchronous transfer mode

ATP—

Advanced Technology Program

BACnet—

Building Automation and Controls Network

BEC—

Bose-Einstein Condensation

BEES—

Building for Environmental and Economic Sustainability

BFRL—

Building and Fire Research Laboratory

BIPM—

Bureau International des Poids et Mésures

BMCD—

Biological Macromolecule Crystallization Database

BRDF—

bidirectional reflectance distribution function

BSED—

backscatter electron diffraction

CAD—

computer-aided design

CAM—

computer-aided manufacturing

CARB—

Center for Advanced Research in Biotechnology

CBS—

Cybernetic Building Systems

CD—

critical dimension

CFD—

computational fluid dynamics

CHRNS—

Center for High Resolution Neutron Scattering

CICE—

Computer-Integrated Construction Environment

CIKS—

computer-integrated knowledge systems

CIRMS—

Council on Ionizing Radiation Measurements and Standards



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An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 1999 Appendix D Acronyms and Abbreviations ACerS— American Ceramic Society ACSL— Advanced Chemical Sciences Laboratory ADL— architecture description language AEC— architecture-engineering-construction AES— Auger electron spectroscopy; advanced encryption standard AFIS— Automated Fingerprint Identification System AFM— atomic force microscopy AHP— analytical hierarchy process AML— Advanced Measurement Laboratory ANSI— American National Standards Institute AP— application protocol API— application programming interfaces APS— American Physical Society ASCE— American Society of Civil Engineers ASHRAE— American Society of Heating, Refrigerating, and Air-conditioning Engineers ASTM— American Society for Testing and Materials ATM— asynchronous transfer mode ATP— Advanced Technology Program BACnet— Building Automation and Controls Network BEC— Bose-Einstein Condensation BEES— Building for Environmental and Economic Sustainability BFRL— Building and Fire Research Laboratory BIPM— Bureau International des Poids et Mésures BMCD— Biological Macromolecule Crystallization Database BRDF— bidirectional reflectance distribution function BSED— backscatter electron diffraction CAD— computer-aided design CAM— computer-aided manufacturing CARB— Center for Advanced Research in Biotechnology CBS— Cybernetic Building Systems CD— critical dimension CFD— computational fluid dynamics CHRNS— Center for High Resolution Neutron Scattering CICE— Computer-Integrated Construction Environment CIKS— computer-integrated knowledge systems CIRMS— Council on Ionizing Radiation Measurements and Standards

OCR for page 231
An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 1999 CIS— closed ion source CMM— coordinated measuring machine CMOS— complementary metal oxide semiconductor CRADA— Cooperative Research and Development Agreement CRDS— cavity ring-down spectrometry CSIRO— Commonwealth Scientific and Industrial Research Organisations CSTL— Chemical Science and Technology Laboratory CTCMS— Center for Theoretical Computational Materials Science DARPA— Defense Advanced Research Projects Agency DASE— Digital TV Application Software Environment EBIT— electron beam ion trap EDFA— erbium-doped fiber amplifier EDS— energy-dispersive spectrometer EEEL— Electronics and Electrical Engineering Laboratory EMC— electromagnetic compatibility ENDF— Evaluated Nuclear Data File EOS— Earth Observing System EPA— Environmental Protection Agency EPR— electron paramagnetic resonance EUV— extreme ultraviolet EUVL-LLC— EUV Lithography-Limited Liability Corporation FARCAL— Facility for Advanced Radiometric Calibrations FASCAL— Facility for Automatic Spectroradiometric Calibrations FBI— Federal Bureau of Investigation FDD— fault detection and diagnostics FDIS— Final Draft International Standard FIZ— Fachinformationszentrum Karlsruhe FSM— Fire-Safe Materials FTIR— Fourier transform infrared FTMW— Fourier transform microwave FTS— Fourier transform spectrometer GAMS— Guide to Available Mathematical Software GaN— gallium nitride GD-OES— glow discharge optical emission spectrometer GHRS— Goddard High Resolution Spectrograph GMR— Giant Magnetoresistance GPS— Global Positioning System HACR— high-accuracy cryogenic radiometer HDTV— high-definition television HPC— high-performance concrete HST— Hubble Space Telescope HTBB— high-temperature black body HVAC— heating, ventilation, and air-conditioning HYPERCON— computer-integrated knowledge system

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An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 1999 IC— integrated circuit ICP-OES— inductively coupled plasma-optical spectrometry IEC— International Electrotechnical Commission IEEE— Institute of Electrical and Electronics Engineers IETF— Internet Engineering Task Force IFSS— Industrial Fire Simulation System IP— Internetwork Protocol IP QoS— IP Quality of Service IPsec— Internetwork Protocol Security IR— infrared; information retrieval ISAM— Intelligent Systems Architecture for Manufacturing ISIS— Information Storage and Interconnect Systems ISO— International Organization for Standardization ISPI— Integrated Services Protocol Instrument ISSC— Information System to Support Calibrations IT— information technology ITL— Information Technology Laboratory ITS— International Temperature Scale LCC— life-cycle cost LCM— liquid composites molding LMDS— Local Multipoint Distribution Service M³— molecular measuring machine MALDI— matrix-assisted laser desorption ionization MBE— molecular beam epitaxy MEL— Manufacturing Engineering Laboratory MEMS— microelectromechanical systems MEP— Manufacturing Extension Partnership MFC— mass flow controller MIRF— Medical and Industrial Radiation Facility MMDS— Multichannel Multipoint Distribution Service MMIC— monolithic microwave integrated circuit MOCVD— metallo-organic chemical vapor deposition MPI— Message Passing Interface MR— magnetic resonance MS— mass spectral MSD— Metrology for Sustainable Development MSEL— Materials Science and Engineering Laboratory NAMT— National Advanced Manufacturing Testbed NASA— National Aeronautics and Space Administration NCNR— NIST Center for Neutron Research NFG— nonfederal governmental NIAP— National Information Assurance Partnership NIH— National Institutes of Health NIOF— Neutron Interferometry and Optics Facility

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An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 1999 NIST— National Institute of Standards and Technology NMR— nuclear magnetic resonance NOAA— National Oceanic and Atmospheric Administration NRC— National Research Council NRL— Naval Research Laboratory NSA— National Security Agency NSF— National Science Foundation NSMP— National Semiconductor Metrology Program NSOM— near-field scanning optical microscopy NTRM— NIST Traceable Reference Materials NTRS— National Technology Roadmap for Semiconductors N-WEST— National Wireless Electronic Systems Testbed OA— other government agencies OAE— Office of Applied Economics OAS— Organization of American States OES— optical emission spectroscopy OIDA— Optoelectronics Industry Development Association OLCI— optical low-coherence interferometry OLES— Office of Law Enforcement Standards OMP— Office of Microelectronics Programs PCR— polymerase chain reaction Pd— palladium PDF— portable document format PHPCT— Partnership for High-Performance Concrete Technology PKI— Public Key Infrastructure PMD— polarization mode dispersion PMMA— polymethylmethacrylate PSSH— Performance Standards Systems for Housing Pt— platinum RBAC— role-based access control RCS— radar cross section RCSB— Research Collaboratory for Structural Bioinformatics REFPROP— refrigerant properties database RF— radio frequency RIMS— resonance ionization mass spectrometry RMA— Reference Model Architecture RTP— rapid thermal processing SAC— Safety Audit Committee SAM— self-assembling monolayer SCM— scanning capacitance microscopy SEMATECH— semiconductor manufacturing technology (consortium) SEMPA— scanning electron microscopy for polarization analysis SI— International System of Units SIA— Semiconductor Industry Association

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An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 1999 SIMnet— Inter-American System of Metrology SIMS— secondary ion mass spectrometry SIRCUS— spectral irradiance and radiance calibration with uniform sources SLP— Service Life Prediction SPIE— Society of Photo-optical Instrumentation Engineers SRD— Standard Reference Database SRM— Standard Reference Material SRO— senior reactor operator STARR— spectral trifunction automated reference reflectometer STEP— standard(s) for the exchange of product model data STM— scanning tunneling microscopy STR— short tandem repeat STRS— Scientific and Technical Research and Services SURF— Synchrotron Ultraviolet Radiation Facility Tc— critical temperature THz— terahertz TOF— time of flight TREC— Text Retrieval Conference TWG— technical working group UL— Underwriters Laboratories ULSI— ultralarge-scale integration USNO— United States Naval Observatory UTC— coordinated universal time UV— ultraviolet VCBT— Virtual Cybernetic Building Testbed VL-BKZ— Valanis-Landel-Bernstein, Kersley, and Zapas VRML— virtual reality modeling language VTT— Technical Research Centre of Finland VUV— vacuum ultraviolet WD XRF— wavelength dispersive x-ray fluorescence WIT— Web-based Interoperability Test XIWT— Cross-Industry Working Team XML— extensible markup language XPS— x-ray photoelectron spectroscopy