| ||||||||||||||||||||||||||||||||||||||||||||||||
|
||||||||||||||||||||||||||||||||||||||||||||||||
Below are the first 10 and last 10 pages of uncorrected machine-read text (when available) of this chapter, followed by the top 30 algorithmically extracted key phrases from the chapter as a whole.
Intended to provide our own search engines and external engines with highly rich, chapter-representative searchable text on the opening pages of each chapter.
Because it is UNCORRECTED material, please consider the following text as a useful but insufficient proxy for the authoritative book pages.
Do not use for reproduction, copying, pasting, or reading; exclusively for search engines.
OCR for page 261
An Assessment of the NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY MEASUREMENT AND STANDARDS LABORATORIES: Fiscal Year 2000
Appendix B
Agendas for Meetings of Board on Assessment of NIST Programs
OCTOBER 7, 1999
National Institute of Standards and Technology, Boulder, Colorado
8:00 a.m.
Continental Breakfast
8:30 a.m.
Facilities Overview, Dave Norcross, Director, Boulder Laboratories
9:45 a.m.
Break
10:00 a.m.
Executive Session
11:30 a.m.
Lunch
Laboratory Tours
12:30 p.m.
Time and Frequency Division, Physics Laboratory
“NIST Primary Frequency Standards”
Presenters: Dawn Meekhof and Don Sullivan
1:00 p.m.
Radio-Frequency Technology Division, Electronics and Electrical Engineering Laboratory
“EM Compatibility Measurements”
Presenter: Dennis Friday
1:30 p.m.
Materials Reliability Division, Materials Science and Engineering Laboratory
“Electron Microscopy Investigations of Interconnect Reliability for Microelectronics”
Presenter: Bob Keller
OCR for page 262
An Assessment of the NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY MEASUREMENT AND STANDARDS LABORATORIES: Fiscal Year 2000
2:00 p.m.
Electromagnetic Technology Division, Electronics and Electrical Engineering Laboratory
“Micro- and Nanoscale Fabrication Facilities”
Presenter: Dick Harris (or colleague)
2:30 p.m.
Optoelectronics Division, Electronics and Electrical Engineering Laboratory
“Measurements for the Optoelectronics Industry”
Presenter: Gordon Day
DECEMBER 9-10, 1999
National Institute of Standards and Technology, Gaithersburg, Maryland
Thursday, December 9
8:30 a.m.
Welcome and Introductions
Linda Capuano, Chair, NRC Board on Assessment of NIST Programs
9:00 a.m.
Introduction to NRC and Overview of Board/Panel Operations
Dorothy Zolandz, Director, Board on Assessment of NIST Programs, National Research Council
9:15 a.m.
NIST Director's Address
Ray Kammer, Director, NIST
9:30 a.m.
Overview of NIST Measurements and Standards Laboratories
Katharine Gebbie, Chair, NIST Laboratory Council and Director, NIST Physics Laboratory
10:30 a.m.
Break
10:45 a.m.
Overview of Technology Services
Richard Kayser, Acting Director, Technology Services
11:45 a.m.
Lunch
12:45 p.m.
Look to the Future for the Measurement and Standards Laboratories
Michael Casassa, Director, NIST Program Office
Dave Norcross, Director, NIST Boulder Laboratories
Leslie Smith, Director, NIST Materials Science and Engineering Laboratory
Belinda Collins, Director, Office of Standards Services, NIST Technology Services
2:15 p.m.
Staff Development, Leadership Training, and Succession Planning
Jack Snell, Director, NIST Building and Fire Research Laboratory
3:15 p.m.
Break
3:30 p.m.
Databases
John Rumble, Chief of the Standard Reference Data Program, NIST Technology Services
4:00 p.m.
Web Security
Barbara Guttman, Deputy Director, NIST Information Technology Laboratory
OCR for page 263
An Assessment of the NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY MEASUREMENT AND STANDARDS LABORATORIES: Fiscal Year 2000
4:30 p.m.
Executive session
6:00 p.m.
Adjourn
Friday, December 10
8:00 a.m.
Executive Session
12 noon
Lunch
1:00 p.m.
Meet with NIST Organizational Unit Heads
Topics: Expectations for Panels, Themes for 2000, Feedback from 1999
3:00 p.m.
Break
3:15 p.m.
Executive Session
3:45 p.m.
Adjourn
MAY 3-4, 2000
National Research Council, Washington, D.C.
Wednesday, May 3
Closed Session
8:00 a.m.
Light Breakfast
8:30 a.m.
Discussion of Board Balance and Composition; Discussion of Candidates for New Members
9:30 a.m.
Review Panel Findings; Identify Overarching Themes
12 noon
Lunch
12:45 p.m.
Transportation to NIST Gaithersburg
Open Session
1:30 p.m.
Tour of NIST Laboratory Facilities
Measuring the Country's Electric Power: The Impact of Deregulation (James Olthoff, Electronics and Electrical Engineering)
Nanoscale Physics Laboratory: Quantum Electronics and Autonomous Atom Assembly (Bob Celotta, Physics Laboratory)
Atomic-Resolution Study of Copper Electrodeposition (Tom Moffat, Materials Science and Engineering Laboratory)
XCALIBIR: X-Ray Optics Calibration Interferometer (Angela Davis, Manufacturing Engineering Laboratory)
OCR for page 264
An Assessment of the NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY MEASUREMENT AND STANDARDS LABORATORIES: Fiscal Year 2000
XML/E-Business: eXtensible Markup Language (XML) Conformance Testing (Mark Skall, Information Technology Laboratory)
Service Life Prediction for Building Materials: The Photodegradation Laboratory (Jon Martin, Building and Fire Research Laboratory)
Standards for Healthcare Measurements (Joe Dalluge, Chemical Science and Technology Laboratory)
4:30 p.m.
Transportation to Holiday Inn, Georgetown
Thursday, May 4
Closed Session
7:30 a.m.
Light Breakfast
Preparation for Meeting with NIST Organizational Unit Heads
8:00 a.m.
Complete Discussion of Overarching Themes
9:30 a.m.
Brainstorm on “Quality Metrics”
10:00 a.m.
Discuss Possibilities for Assessment of Interlaboratory Activities
10:30 a.m.
Globalization Issues
11:00 a.m.
Discuss Process and Lessons Learned
Open Session
11:30 a.m.
Discussion with NIST Organizational Unit Heads on Overarching Themes/Issues
12:30 p.m.
Lunch
1:00 p.m.
Discussion of “Quality Metrics”
1:30 p.m.
Discussion of Assessment of Interlaboratory Programs
2:00 p.m.
NIST Measurement and Standards Laboratories Budget: Current Budget Status and Strategies for Coping
Karen Brown, Deputy Director, NIST
Role of Board on Assessment in Budget Issues—Open Discussion
Closed Session
2:30 p.m.
Rethink Issues Based upon Meeting with NIST Staff
3:30 p.m.
Meeting Adjourns
Representative terms from entire chapter:
electrical engineering
